Title :
An on-chip monitor for statistically significant circuit aging characterization
Author :
Keane, John ; Zhang, Wei ; Kim, Chris H.
Author_Institution :
Dept. of ECE, Univ. of Minnesota, Minneapolis, MN, USA
Abstract :
We present an array-based system to accurately study variations in ROSC aging. Microsecond measurements for minimal BTI recovery, and frequency shift measurement resolution ranging down to the error floor of 0.07% are achieved with three beat frequency detection systems working in tandem. Measurement results from a 65nm test chip show that fresh frequency and Δf are uncorrelated, both the μ and σ of Δf increase with stress, and σ(Δf)/μ(Δf) decreases with stress time.
Keywords :
ageing; oscillators; BTI recovery; ROSC aging; array-based system; beat frequency detection system; frequency shift measurement resolution; microsecond measurement; on-chip monitor; size 65 nm; statistically significant circuit aging characterization;
Conference_Titel :
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4424-7418-5
Electronic_ISBN :
0163-1918
DOI :
10.1109/IEDM.2010.5703293
