DocumentCode
2367845
Title
Extracting precise diagnosis of bridging faults from stuck-at fault information
Author
Arslan, Baris ; Orailoglu, Alex
Author_Institution
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
fYear
2003
fDate
16-19 Nov. 2003
Firstpage
230
Lastpage
235
Abstract
Although the stuck-at fault model is the standard fault model. the frequently occurring faults in some technologies arc unintentional shorts, denoted as bridging faults. We outline a method that utilizes the information from the stuck-at fault model to accurately diagnose the bridging faults that affect two lines. The proposed method exploits the observation that the bridging fault response matches the stuck-at fault responses on the shorted lines for the failing test vectors and generates a candidate list that accounts for all failures. A further reduction in the size of the candidate set is achieved by extracting information from the test vectors that do not fail. The proposed method uses no layout information whatsoever. Nonetheless, the experimental results indicate that the bridging faults can be accurately diagnosed delivering a reduction in the sizes of the ambiguity sets and full capture of the offending bridging fault.
Keywords
fault simulation; logic testing; HOPE fault simulation tool; bridging faults; candidate list; failing test vectors; fault dictionaries; fault response; precise diagnosis; shorted lines; stuck-at fault model; Bridge circuits; CMOS technology; Circuit faults; Circuit testing; Data mining; Fault detection; Fault diagnosis; Logic circuit testing; Manufacturing processes; Process design; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2003. ATS 2003. 12th Asian
ISSN
1081-7735
Print_ISBN
0-7695-1951-2
Type
conf
DOI
10.1109/ATS.2003.1250815
Filename
1250815
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