Title :
Fault diagnosis for physical defects of unknown behaviors
Author :
Wen, Xiaoqing ; Tamamoto, Hideo ; Saluja, Kewal K. ; Kinoshita, Kozo
Author_Institution :
SynTest Technol., Inc., Sunnyvale, CA, USA
Abstract :
This paper proposes an X-fault model for fault diagnosis of physical defects with unknown behaviors by using X symbols. An efficient X-fault simulation method and an efficient X-fault diagnostic reasoning method are presented. Based on these, an X-fault diagnosis method is described to improve the failure analysis for a wide range of physical defects in complex IC circuits.
Keywords :
diagnostic reasoning; fault simulation; integrated circuit testing; logic simulation; logic testing; symbol manipulation; X symbols; X-fault model; complex IC circuits; diagnostic reasoning method; efficient X-fault simulation method; failure analysis; fault diagnosis; gate-level circuit; logic combination; physical defects; symbolic simulation; two-valued simulation; unknown behaviors; Circuit faults; Circuit simulation; Delay effects; Diagnostic reasoning; Failure analysis; Fault diagnosis; Informatics; Integrated circuit testing; Logic circuit testing; Logic circuits; Performance analysis; Silicon; Symbol manipulation; Threshold voltage;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250816
