Title :
Modeling of carbon nanotube-metal contact losses in electronic devices
Author :
Elkadi, Asmaa ; El-Ghazaly, Samir M.
Author_Institution :
Dept. of Electr. Eng., Univ. of Arkansas, Fayetteville, AR, USA
Abstract :
In this paper, we introduce an efficient approach to estimate the losses of carbon nanotube-based devices. The approach is based on realistic operational parameters beyond quantum limits. It calculates the electric resistance and conductance for different devices with different numbers of carbon nanotubes. The model shows good agreement with experimental data. An efficient approach to estimate the number of nanotubes per device has also been developed. The model can be easily implemented in commercial simulators.
Keywords :
carbon nanotubes; contact resistance; electric admittance; nanotube devices; semiconductor device models; C; carbon nanotube based devices; carbon nanotube-metal contact losses; electric conductance; electric resistance; electronic devices; operational parameters; quantum limits; Carbon nanotubes; Conductivity; Contact resistance; Electrical resistance measurement; Mathematical model; Resistance; Contact resistance; losses; semiconducting single-wall carbon nanotube;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-5544-2
DOI :
10.1109/ISEMC.2014.6898969
