• DocumentCode
    2367965
  • Title

    A novel method for online in-place detection and location of multiple interconnect faults in SRAM based FPGAs

  • Author

    Kumar, L. Kalyan ; Mupid, Amol J. ; Ramani, Aditya S. ; Kamakoti, V.

  • Author_Institution
    Indian Inst. of Technol. - Madras, Chennai, India
  • fYear
    2003
  • fDate
    16-19 Nov. 2003
  • Firstpage
    262
  • Lastpage
    265
  • Abstract
    This paper describes a novel method for online in-place detection and location of interconnects faults in SRAM-based FPGA systems. In safety critical systems like space probes, online checkers report misbehavior of sub-circuits within the system. When one such sub-circuit is reported to misbehave, the algorithm proposed in this paper performs run time reconfiguration (RTR) of LUTs in an attempt to detect and locate the interconnect faults, if any, within the faulty sub-circuit. Even in the subcircuit under test, at any given time, only a small section of the LUTs are used by the testing procedure. In this way the degradation of the application is kept at a minimum. The proposed algorithm is in-place, i.e. it does not alter the routing structure of the application.
  • Keywords
    SRAM chips; fault diagnosis; field programmable gate arrays; logic testing; table lookup; LUT; SRAM based FPGA; inverse pass mode; multiple interconnect faults; normal pass mode; online in-place detection; online in-place location; run time reconfiguration; safety critical systems; space probes; stuck faults; Fault detection; Fault diagnosis; Field programmable gate arrays; Logic circuit testing; Logic programming; Logic testing; Probes; Random access memory; Routing; SRAM chips; Safety; Space technology; Table lookup;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2003. ATS 2003. 12th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-1951-2
  • Type

    conf

  • DOI
    10.1109/ATS.2003.1250820
  • Filename
    1250820