Title :
BDD based synthesis of symmetric functions with full path-delay fault testability
Author :
Shi, Junhao ; Fey, Görschwin ; Drechsler, Rolf
Author_Institution :
Inst. of Comput. Sci., Bremen Univ., Germany
Abstract :
A new technique for synthesizing totally symmetric Boolean functions is presented that achieves complete robust path delay fault testability. BDDs are used for the synthesis step. Only one additional input and one inverter are needed to achieve 100% Path Delay Fault (PDF) testability. The size of the circuit is guaranteed to be at most quadratic in the number of inputs. The test vectors for any PDF can be generated in linear time. Experimental results underline the efficiency of the technique. In contrast to previous approaches, the technique can also be applied to multi-output functions.
Keywords :
Boolean functions; VLSI; binary decision diagrams; design for testability; fault simulation; logic CAD; logic testing; BDD based synthesis; CUDD; fault model; multi-output functions; number of inputs; robust path delay fault testability; totally symmetric Boolean functions; Binary decision diagrams; Boolean functions; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Design automation; Design for testability; Inverters; Logic arrays; Logic circuit testing; Logic testing; Propagation delay; Very-large-scale integration;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250825