• DocumentCode
    2368079
  • Title

    A Simplified Control Algorithm for Shunt Active Power Filter Without Load and Filter Current Measurement

  • Author

    Ozdemir, Engin ; Ucar, Mehmet ; Kesler, Metin ; Kale, Murat

  • Author_Institution
    Dept. of Electr. Educ., Kocaeli Univ.
  • fYear
    2006
  • fDate
    6-10 Nov. 2006
  • Firstpage
    2599
  • Lastpage
    2604
  • Abstract
    In this study, a new control algorithm for three-phase shunt active power filter (APF) is proposed without load and filter current measurement. The proposed control method, based on instantaneous reactive power (IRP) theory, requires only measuring the source currents in order to reduce the number of current sensors (CSs) required in the conventional control approach. The source currents are exactly in phase with the line voltages and approximately sinusoidal waveform after compensation. The proposed control technique has been simulated Matlab/Simulink and tested under thyristor bridge rectifier load condition, and validated with a 10 kVA/380 V experimental prototype based on digital signal processor (DSP) TMS320F2812. Both simulation and experimental test results demonstrate viability of the proposed method, successful in meeting the IEEE 519-1992 recommended harmonic standard limits
  • Keywords
    IEEE standards; active filters; digital signal processing chips; power harmonic filters; rectifying circuits; 10 kVA; 380 V; DSP; IEEE 519-1992 recommended harmonic standard limits; Matlab; Simulink; TMS320F2812; compensation; digital signal processor; filter current measurement; instantaneous reactive power theory; load current measurement; shunt active power filter; source currents measurement; thyristor bridge rectifier load condition; Active filters; Bridge circuits; Cascading style sheets; Current measurement; Power measurement; Reactive power control; Signal processing algorithms; Testing; Thyristors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on
  • Conference_Location
    Paris
  • ISSN
    1553-572X
  • Print_ISBN
    1-4244-0390-1
  • Type

    conf

  • DOI
    10.1109/IECON.2006.347260
  • Filename
    4153202