Title :
ESD damage and solutions in tape head manufacturing
Author :
Lam, Michelle ; Bookin, William ; Czarnecki, Stanley ; Golcher, Peter ; Iben, Icko E T ; Richard, D.J.
Author_Institution :
IBM, San Jose
Abstract :
Magnetic tape heads use a multiplicity of highly ESD sensitive read sensors. With 36 or more sensors per head in a magnetic storage tape drive, a loss in a manufacturing environment of 1000 ppm per sensor is very costly. ESD damages caused by manufacturing processes, fixtures, material and faulty testers are investigated and reviewed. A new type of ESD failure is revealed in the study. Solutions are suggested to improve and amend the observed problems.
Keywords :
electrostatic discharge; failure analysis; magnetic heads; magnetic sensors; magnetic tape storage; magnetic tapes; ESD damage; ESD sensitive read sensors; magnetic storage tape drive; tape head manufacturing; Anisotropic magnetoresistance; Assembly; Cable shielding; Electrostatic discharge; Magnetic anisotropy; Magnetic heads; Magnetic memory; Magnetic sensors; Manufacturing processes; Perpendicular magnetic anisotropy;
Conference_Titel :
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-136-5
DOI :
10.1109/EOSESD.2007.4401744
