DocumentCode
2368122
Title
ESD damage and solutions in tape head manufacturing
Author
Lam, Michelle ; Bookin, William ; Czarnecki, Stanley ; Golcher, Peter ; Iben, Icko E T ; Richard, D.J.
Author_Institution
IBM, San Jose
fYear
2007
fDate
16-21 Sept. 2007
Abstract
Magnetic tape heads use a multiplicity of highly ESD sensitive read sensors. With 36 or more sensors per head in a magnetic storage tape drive, a loss in a manufacturing environment of 1000 ppm per sensor is very costly. ESD damages caused by manufacturing processes, fixtures, material and faulty testers are investigated and reviewed. A new type of ESD failure is revealed in the study. Solutions are suggested to improve and amend the observed problems.
Keywords
electrostatic discharge; failure analysis; magnetic heads; magnetic sensors; magnetic tape storage; magnetic tapes; ESD damage; ESD sensitive read sensors; magnetic storage tape drive; tape head manufacturing; Anisotropic magnetoresistance; Assembly; Cable shielding; Electrostatic discharge; Magnetic anisotropy; Magnetic heads; Magnetic memory; Magnetic sensors; Manufacturing processes; Perpendicular magnetic anisotropy;
fLanguage
English
Publisher
ieee
Conference_Titel
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location
Anaheim, CA
Print_ISBN
978-1-58537-136-5
Type
conf
DOI
10.1109/EOSESD.2007.4401744
Filename
4401744
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