• DocumentCode
    2368219
  • Title

    Selection of a proper model based on PV modules under outdoor characteristics

  • Author

    Mahammed, I. Hadj ; Bakelli, Y. ; Oudjana, S. Hamid ; Arab, A. Hadj ; Berrah, S.

  • Author_Institution
    Appl. Res. Unit on Renewable Energies, URAER, Ghardaïa, Algeria
  • fYear
    2012
  • fDate
    18-25 May 2012
  • Firstpage
    854
  • Lastpage
    859
  • Abstract
    In the current work, five parameters model (FPM) has been used to improve the accuracy of the I-V PV module real characteristics. The mentioned model has been put into an outdoor characteristic tests of five different technology PV modules in Ghardaia site. The namely proposed PV module technologies are: Mono-crystalline silicon, polycrystalline silicon, triple-junction Amorphous and Thin-film (CIS). The tests were carried out under different climatic conditions of an arid area about 600km south of the Mediterranean coast. The analysis of the recorded results by mean of the RMSE (root mean square error) method averred that the obtained error is converged to a minimum value. Taking into account of different error origins and measurement method, it can be concluded that the mentioned model fits better with accuracy to characterize PV modules. The proposed method is also discussed.
  • Keywords
    mean square error methods; photovoltaic power systems; silicon; thin films; FPM; RMSE; five parameters model; monocrystalline silicon; outdoor characteristics; photovoltaic modules; polycrystalline silicon; root mean square error method; thin film; triple-junction amorphous; Correlation; Current measurement; Mathematical model; Photovoltaic systems; Resistors; Temperature measurement; Photovoltaic module; characterization; modeling simulation; outdoor measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environment and Electrical Engineering (EEEIC), 2012 11th International Conference on
  • Conference_Location
    Venice
  • Print_ISBN
    978-1-4577-1830-4
  • Type

    conf

  • DOI
    10.1109/EEEIC.2012.6221495
  • Filename
    6221495