• DocumentCode
    2368279
  • Title

    Data partition based reliability modeling

  • Author

    Tian, Jeff ; Palma, Joe

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Southern Methodist Univ., Dallas, TX, USA
  • fYear
    1996
  • fDate
    30 Oct-2 Nov 1996
  • Firstpage
    354
  • Lastpage
    363
  • Abstract
    The paper presents an approach to software reliability modeling using data partitions derived from tree based models. We use these data sensitive partitions to group data into clusters with similar failure intensities. The series of data clusters associated with different time segments forms a piecewise linear model for the assessment and short term prediction of reliability. Long term prediction can be provided by the dual model that uses these grouped data as input fitted to some failure count variations of the traditional software reliability growth models. These partition based reliability models can be used effectively to measure and predict the reliability of software systems and can be readily integrated into our strategy of reliability assessment and improvement using tree based modeling
  • Keywords
    piecewise-linear techniques; probability; software fault tolerance; software metrics; software performance evaluation; software reliability; trees (mathematics); data clusters; data partition based reliability modeling; data sensitive partitions; dual model; failure count variations; failure intensities; grouped data; long term prediction; partition based reliability models; piecewise linear model; reliability assessment; short term prediction; software reliability growth models; software reliability modeling; time segments; tree based modeling; tree based models; Application software; Computer science; Data engineering; Fluctuations; Piecewise linear techniques; Predictive models; Random variables; Reliability engineering; Software systems; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 1996. Proceedings., Seventh International Symposium on
  • Conference_Location
    White Plains, NY
  • Print_ISBN
    0-8186-7707-4
  • Type

    conf

  • DOI
    10.1109/ISSRE.1996.558895
  • Filename
    558895