• DocumentCode
    236843
  • Title

    Statistical analysis in EMC using dimension reduction methods

  • Author

    Thomas, David W. P. ; Oke, O.A. ; Smartt, Christopher

  • Author_Institution
    George Green Inst. for Electromagn. Res., Univ. of Nottingham, Nottingham, UK
  • fYear
    2014
  • fDate
    4-8 Aug. 2014
  • Firstpage
    316
  • Lastpage
    321
  • Abstract
    Many proposed efficient statistical analysis methods in EMC are limited due to the dimensionality problem; when the number of random variables becomes large the methods can become less efficient than using the established Monte Carlo method. In this paper the univariate and bivariate dimension reduction methods are examined for their applicability and efficiency for statistical EMC analysis. The performance of the techniques is evaluated using an example of coupling between wires within an enclosure and compared with the Monte Carlo Method.
  • Keywords
    electromagnetic compatibility; statistical analysis; EMC; bivariate dimension reduction methods; statistical analysis; univariate dimension reduction methods; Couplings; Electromagnetic compatibility; Estimation; Monte Carlo methods; Random variables; Standards; Wires; EMC; Univariate dimension reduction; bivariate dimension reduction; statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
  • Conference_Location
    Raleigh, NC
  • Print_ISBN
    978-1-4799-5544-2
  • Type

    conf

  • DOI
    10.1109/ISEMC.2014.6898990
  • Filename
    6898990