DocumentCode
236843
Title
Statistical analysis in EMC using dimension reduction methods
Author
Thomas, David W. P. ; Oke, O.A. ; Smartt, Christopher
Author_Institution
George Green Inst. for Electromagn. Res., Univ. of Nottingham, Nottingham, UK
fYear
2014
fDate
4-8 Aug. 2014
Firstpage
316
Lastpage
321
Abstract
Many proposed efficient statistical analysis methods in EMC are limited due to the dimensionality problem; when the number of random variables becomes large the methods can become less efficient than using the established Monte Carlo method. In this paper the univariate and bivariate dimension reduction methods are examined for their applicability and efficiency for statistical EMC analysis. The performance of the techniques is evaluated using an example of coupling between wires within an enclosure and compared with the Monte Carlo Method.
Keywords
electromagnetic compatibility; statistical analysis; EMC; bivariate dimension reduction methods; statistical analysis; univariate dimension reduction methods; Couplings; Electromagnetic compatibility; Estimation; Monte Carlo methods; Random variables; Standards; Wires; EMC; Univariate dimension reduction; bivariate dimension reduction; statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location
Raleigh, NC
Print_ISBN
978-1-4799-5544-2
Type
conf
DOI
10.1109/ISEMC.2014.6898990
Filename
6898990
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