Title :
Improvement of detectability for CMOS floating gate defects in supply current test
Author :
Michinishi, Hiroyuki ; Yokohira, Tokumi ; Okamoto, Takuji ; Kobayashi, Toshifumi ; Hondo, Tsutomu
Author_Institution :
Fac. of Eng., Okayama Univ. of Sci., Japan
Abstract :
We already proposed a supply current test method for detecting floating gate defects in CMOS ICs. In the method, increase of the supply current caused by defects is promoted by superposing a sinusoidal signal on the supply voltage. In this study, we propose one way to improve detectability of the method for the defects. They are detected by analyzing the frequency of supply current and judging whether secondary harmonics of the sinusoidal signal exist or not. Effectiveness of our way is confirmed by some experiments.
Keywords :
CMOS logic circuits; built-in self test; equivalent circuits; integrated circuit testing; logic testing; CMOS NAND gates; CMOS floating gate defects; defect detectability; equivalent test circuit; secondary harmonics; sinusoidal signal; supply current test; CMOSFET logic devices; Circuit testing; Current supplies; Electronic equipment testing; Electronics industry; Equivalent circuits; Frequency estimation; Gas detectors; Harmonic analysis; Integrated circuit testing; Logic circuit testing; Power supplies; Self-testing; Semiconductor device testing; Voltage;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250846
