Title :
Effect of large device capacitance on FICDM peak current
Author :
Atwood, B.C. ; Yuanzhong Zhou ; Clarke, D. ; Weyl, T.
Author_Institution :
Analog Devices, Inc., Wilmington
Abstract :
This paper gives solutions to the differential equations of the FICDM tester. Data and theory show that the peak current for FICDM tests increases as the DUT capacitance increases, but approaches a maximum that is a function of the tester field plate capacitance and becomes rather independent of the DUT capacitance.
Keywords :
capacitance measurement; capacitors; differential equations; electron device testing; DUT capacitance; FICDM peak current; FICDM test; device under test; differential equation; field induced charged device model; large device capacitance; tester field plate capacitance; Capacitance; Capacitors; Circuit testing; Data mining; Differential equations; Electronics packaging; Equivalent circuits; Inductance; Oscilloscopes; Sparks;
Conference_Titel :
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-136-5
DOI :
10.1109/EOSESD.2007.4401763
