DocumentCode
2368533
Title
Large signal substrate modeling in RF SOI technologies
Author
Parthasarathy, Shyam ; Swaminathan, Balaji ; Sundaram, Ananth ; Groves, Robert A. ; Wolf, Randy L. ; AndersoN, Frederick G.
Author_Institution
IBM SRDC, Bangalore, India
fYear
2010
fDate
6-8 Dec. 2010
Abstract
This paper describes a large signal Silicon on Insulator (SOI) substrate modeling methodology for high power circuit applications such as RF Switches. It is shown that the use of a varactor in place of a linear capacitor representing the buried oxide (BOX) improves the harmonic predictions of the circuit. The new substrate model is validated against 2nd and 3rd harmonics of an RF SOI switch operating at 890 MHz.
Keywords
harmonic distortion; microwave switches; silicon-on-insulator; substrates; BOX; RF SOI technology; Si; buried oxide; frequency 890 MHz; harmonic prediction; high power circuit application; large signal substrate modeling; linear capacitor; silicon on insulator;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location
San Francisco, CA
ISSN
0163-1918
Print_ISBN
978-1-4424-7418-5
Electronic_ISBN
0163-1918
Type
conf
DOI
10.1109/IEDM.2010.5703320
Filename
5703320
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