Title :
A novel testing approach for full-chip CDM characterization
Author :
Gerdemann, Alex ; Rosenbaum, Elyse ; Stockinger, Michael
Author_Institution :
Univ. of Illinois at Urbana-Champaign, Urbana
Abstract :
This work describes a new testing system for use in measuring the full-chip response to CDM-like discharge phenomena. It includes a new form of the cc-TLP system and monitoring strategies that allow measurement of internal voltage waveforms during a discharge.
Keywords :
electrostatic discharge; integrated circuit testing; discharge phenomena; full-chip CDM characterization; internal voltage waveforms; novel testing system; Capacitance; Capacitors; Circuit testing; Current measurement; Monitoring; Packaging; Power transmission lines; Semiconductor device measurement; System testing; Voltage;
Conference_Titel :
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-136-5
DOI :
10.1109/EOSESD.2007.4401765
