DocumentCode
2368549
Title
A novel testing approach for full-chip CDM characterization
Author
Gerdemann, Alex ; Rosenbaum, Elyse ; Stockinger, Michael
Author_Institution
Univ. of Illinois at Urbana-Champaign, Urbana
fYear
2007
fDate
16-21 Sept. 2007
Abstract
This work describes a new testing system for use in measuring the full-chip response to CDM-like discharge phenomena. It includes a new form of the cc-TLP system and monitoring strategies that allow measurement of internal voltage waveforms during a discharge.
Keywords
electrostatic discharge; integrated circuit testing; discharge phenomena; full-chip CDM characterization; internal voltage waveforms; novel testing system; Capacitance; Capacitors; Circuit testing; Current measurement; Monitoring; Packaging; Power transmission lines; Semiconductor device measurement; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location
Anaheim, CA
Print_ISBN
978-1-58537-136-5
Type
conf
DOI
10.1109/EOSESD.2007.4401765
Filename
4401765
Link To Document