• DocumentCode
    2368671
  • Title

    Worst-case crosstalk noise analysis based on dual-exponential noise metrics

  • Author

    Sun, Jiaxing ; Zheng, Yun ; Ye, Qing ; Ye, Tianchun

  • Author_Institution
    Dept. of IC Design, Chinese Acad. of Sci., Beijing, China
  • fYear
    2005
  • fDate
    3-7 Jan. 2005
  • Firstpage
    348
  • Lastpage
    353
  • Abstract
    Based on the assumption that crosstalk noise is dual-exponential waveform, in this paper we present the closed-form crosstalk noise metrics including the peak noise amplitude Vp, peak noise occurring time Tp and pulse width Wn. Then using part of our metrics we study aggressors switching times alignment that leads to worst-case crosstalk noise for a quiet victim from the analysis of peak noise window (PNW). The SPICE simulation results confirm the accuracy of our metrics and our analysis.
  • Keywords
    CMOS digital integrated circuits; SPICE; circuit simulation; crosstalk; integrated circuit design; integrated circuit noise; noise measurement; SPICE simulation; dual-exponential noise metrics; peak noise amplitude; peak noise occurring time; peak noise window; pulse width; worst-case crosstalk noise analysis; CMOS technology; Circuit noise; Crosstalk; Driver circuits; Equivalent circuits; Integrated circuit interconnections; Integrated circuit noise; Noise level; SPICE; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2005. 18th International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-2264-5
  • Type

    conf

  • DOI
    10.1109/ICVD.2005.173
  • Filename
    1383300
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2368671