DocumentCode :
2368682
Title :
A 180 Amp/4.5 kV 4H-SiC PiN Diode for High Current Power Modules
Author :
Hull, Brett A. ; Das, Mrinal K. ; Richmond, James T. ; Sumakeris, Joseph J. ; Leonard, Robert ; Palmour, John W. ; Leslie, Scott
Author_Institution :
Cree, Inc., Durham, NC
fYear :
2006
fDate :
4-8 June 2006
Firstpage :
1
Lastpage :
4
Abstract :
Discrete 4H-SiC PiN diode chips have been developed for extremely high power handling applications. These diodes have a forward voltage of less than 3.2 V at 180 A (100 A/cm) and are capable of blocking 4.5 kV with a reverse leakage current of less than one muA. At 1.5 cm times 1.5 cm, these discrete 4H-SiC PiN diode chips have over two times the area of the previous largest discrete 4H-SiC power device. Furthermore, considerable progress has been made in achieving VF stability, as no measurable increase in VF was observed on a packaged diode following a 120 hour DC stress at 90 A. When switched from 180 A forward current at a dI/dt of 300 A/mus, the diodes showed a peak reverse current of 50 A and a reverse recovery time of 320 ns. These diodes demonstrate the outstanding capabilities of 4H-SiC power devices given state-of-the-art 4H-SiC substrates, epitaxy, device design, and processing
Keywords :
leakage currents; p-i-n diodes; power semiconductor devices; silicon compounds; wide band gap semiconductors; 120 hr; 180 A; 320 ns; 4.5 kV; 50 A; 90 A; DC stress; SiC; discrete PiN diode chips; discrete power semiconductor device; high current power modules; leakage current; voltage stability; Current measurement; Diodes; Leakage current; Multichip modules; Packaging; Semiconductor device measurement; Stability; Stress measurement; Time measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and IC's, 2006. ISPSD 2006. IEEE International Symposium on
Conference_Location :
Naples
Print_ISBN :
0-7803-9714-2
Type :
conf
DOI :
10.1109/ISPSD.2006.1666125
Filename :
1666125
Link To Document :
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