Title :
External (transient) latchup phenomenon investigated by optical mapping (TIM) technique
Author :
Domanski, Krzysztof ; Heer, Michael ; Esmark, Kai ; Pogany, Dionyz ; Stadler, Wolfgang ; Gornik, Erich
Author_Institution :
Infineon Technol. AG, Neubiberg
Abstract :
Substrate current distribution as trigger for external latchup (LU) and transient latchup (TLU) is detected successfully by means of optical transient interferometric mapping (TIM) technique. The substrate current flow is studied on transient base and for various guard-ring configurations. TIM uncovers proximity effects causing substrate current crowding which are important for the definition of LU protection concepts.
Keywords :
CMOS integrated circuits; light interferometry; substrates; transient analysis; CMOS integrated circuits; current crowding; external latchup phenomenon; guard-ring configurations; optical mapping technique; optical transient interferometric mapping; proximity effects; substrate current distribution; substrate current flow; transient latchup; Electrostatic discharge; Laser beams; Optical distortion; Optical interferometry; Optical refraction; Optical sensors; Optical variables control; Protection; Proximity effect; Thyristors;
Conference_Titel :
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-136-5
DOI :
10.1109/EOSESD.2007.4401773
