• DocumentCode
    2368767
  • Title

    A new versatile high speed pattern generator for nanolithography

  • Author

    Wei, Shuhua ; Liu, Wei ; Li Ham

  • Author_Institution
    Inst. of Electr. Eng., Chinese Acad. of Sci., Beijing
  • fYear
    2008
  • fDate
    24-27 March 2008
  • Firstpage
    824
  • Lastpage
    828
  • Abstract
    A new versatile high speed pattern generator for nanolevel structure research and applications has been designed and developed. The digital signal processor (DSP) is employed in the pattern generator, so coordinates of exposure points inside. the primitive shapes can be calculated with a very high speed. The beam scanning of scanning electron microscope (SEM) is controlled by two sets of 16 bit digital-to-analog converters (DACs). Meanwhile the hardware can acquire SEM images, transfer data and control laser stage. Users can design various patterns and import common industrial layouts such as CIF/GDSII format files by the software package. The powerful display, drawing, and editing capabilities of the software package can accomplish different user necessities for pattern design. The experiments indicate the resolution can approach nanometer, and the field stitching accuracy better than 0.2 mum.
  • Keywords
    digital signal processing chips; digital-analogue conversion; electron beam lithography; nanoelectronics; nanolithography; scanning electron microscopy; 16 bit digital-to-analog converters; SEM images; beam scanning technique; digital signal processor; electron beam lithography; field stitching accuracy; high speed pattern generator; nanofabrication; nanolevel structure research; nanolithography; scanning electron microscope; software package; Digital signal processing; Digital signal processors; Electron beams; Laser beams; Nanolithography; Nanostructures; Scanning electron microscopy; Shape; Signal generators; Software packages; Electron beam lithography; Nanofabrication; Nanolithography; Pattern design; Pattern generator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1572-4
  • Electronic_ISBN
    978-1-4244-1573-1
  • Type

    conf

  • DOI
    10.1109/INEC.2008.4585610
  • Filename
    4585610