Title :
Test-point selection algorithm using small signal model for scan-based BIST
Author :
Hu, He ; Yihe, Sun
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Abstract :
A test point selection algorithm TEPSAUS (TEst-Point Selection Algorithm Using Small signal model) for scan based build-in self-test (BIST) is proposed in this paper, In order to reduce the computational complexity, the algorithm uses Small Signal Model (SSM) to build recursion formulas for cost reduction functions. With the recursion functions, the cost reduction functions can be calculated efficiently.
Keywords :
automatic test pattern generation; built-in self test; circuit complexity; recursive functions; TEPSAUS algorithm; computational complexity; cost reduction functions; random test pattern generation; recursion formulas; scan-based BIST; small signal model; test-point selection algorithm; Automatic testing; Benchmark testing; Built-in self-test; Computational complexity; Controllability; Cost function; Fault detection; Microelectronics; Observability; Recursive estimation; Self-testing; Sun;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250877
