DocumentCode
2368871
Title
Accuracy and convergence properties of a one-dimensional numerical non-quasi-static MOSFETs model for circuit simulation
Author
Robilliart, Etienne ; Dubois, Emmanuel
Author_Institution
CNRS, Villeneuve d´´Ascq, France
fYear
1996
fDate
2-4 Sept. 1996
Firstpage
179
Lastpage
180
Abstract
Accurate modeling of static currents, conductance and charge dynamics are essential for the design of digital and specially for analog circuits. In the analog domain, the shortcomings of many modeling approaches often originate from transistors biased between linear and saturation regimes where discontinuities limit the accuracy and the convergence properties. Moreover, the finite charging/discharging time of the channel may significantly degrade the performances of modern circuit architectures due to charge injection. However, most MOSFET models reveal poor prediction capabilities for high frequency operations for which quasi-static (QS) operation is often violated. In this paper we discuss the accuracy and numerical properties of a one-dimensional CAD-oriented model. It is shown that the proposed model is continuous over all operating regimes and suitable for the analysis of long and short channel MOSFETs. The most interesting feature of our model, an implicit non-quasi-static (NQS) treatment of the charge redistribution, is outlined. Finally, convergence properties are discussed with a special emphasis on the mobility model and on the related nonlinear resolution scheme.
Keywords
MOS integrated circuits; MOSFET; carrier mobility; circuit CAD; circuit analysis computing; integrated circuit design; semiconductor device models; CAD-oriented model; charge dynamics; charge redistribution; circuit simulation; convergence properties; finite charging/discharging time; long channel MOSFET; mobility model; nonlinear resolution scheme; nonquasistatic MOSFET; one-dimensional numerical model; short channel MOSFET; static currents; Analog circuits; Charge carrier processes; Circuit simulation; Convergence of numerical methods; Degradation; Electronic mail; MOSFET circuits; Modems; Numerical models; Poisson equations;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices, 1996. SISPAD 96. 1996 International Conference on
Print_ISBN
0-7803-2745-4
Type
conf
DOI
10.1109/SISPAD.1996.865328
Filename
865328
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