Title :
Evaluation of radiated emissions from multi-port integrated connector modules (ICM) by S-parameters
Author :
Hongmei Fan ; Jianquan Lou ; Hailong Zhang ; Jinghan Yu ; Bhobe, Alpesh ; Feng Ji ; Dewen Xu ; Wenbin Ma ; Xinyi Hu
Author_Institution :
Cisco Syst. (China) R&D Co. Ltd., Shanghai, China
Abstract :
In this paper we present a systematic method to evaluate radiation of multi-port integrated connector modules (ICM) by S-parameters. A novel test jig is designed and built to measure S-parameters of two columns of ICM ports simultaneously. Based on radiation physics of ICM, a radiation model is created and an F factor to correlate S-parameters to far field radiation is defined. A good correlation is found between the F value and radiation from ICM ports.
Keywords :
S-parameters; electric connectors; electromagnetic compatibility; multiport networks; F factor; ICM ports; ICM radiation physics; S-parameters; electromagnetic compatibility; far field radiation; multiport integrated connector modules; radiated emission evaluation; systematic method; test jig; Connectors; Correlation; Crosstalk; Integrated circuit modeling; Ports (Computers); Scattering parameters; Testing;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-5544-2
DOI :
10.1109/ISEMC.2014.6899023
