Title :
Substrate injection characterization in CMOS mixed signal systems on chip
Author :
du Roscoat, Laure Rolland ; Hourany, J. ; Regnauld, V. ; Gamand, P.
Author_Institution :
Innovation Center for Radio Frequency NXP Semicond., Caen
Abstract :
With the increasing integration in consumer electronic products, complex mixed signals circuits have been developed for RF systems on chip. Digital blocks generate parasitic signals, which may affect sensitive sections, especially through substrate. This paper presents a measurement structure designed to characterize the signals injected into the substrate. Measurements of digital blocks designed with various layout options will allow to find a better layout methodology to improve isolation between design blocks in a 65nm CMOS technology.
Keywords :
CMOS integrated circuits; consumer electronics; system-on-chip; CMOS mixed signal; RF systems; consumer electronic; digital blocks; parasitic signals; size 65 nm; substrate injection characterization; systems on chip; CMOS technology; Consumer electronics; Integrated circuit measurements; Isolation technology; RF signals; Radio frequency; Semiconductor device measurement; Signal design; Signal generators; System-on-a-chip;
Conference_Titel :
Research in Microelectronics and Electronics Conference, 2007. PRIME 2007. Ph.D.
Conference_Location :
Bordeaux
Print_ISBN :
978-1-4244-1000-2
Electronic_ISBN :
978-1-4244-1001-9
DOI :
10.1109/RME.2007.4401802
