DocumentCode :
2369184
Title :
Effect of pressure on nanocrystalline diamond films deposition by hot (lament CVD technique from CH4/H2/Ar gas mixture
Author :
Shumin Yang ; Zhoutong He ; Dezhang Zhu ; Jinlong Gong
Author_Institution :
Shanghai Inst. of Appl. Phys.,, Chinese Acad. of Sci., Shanghai
fYear :
2008
fDate :
24-27 March 2008
Firstpage :
928
Lastpage :
930
Abstract :
The effect of pressure on the deposition of nanocrystalline diamond (NCD) Films in a hot filament chemical vapor deposition (IFCVD) system was investigated using CH4/H2/Ar gas mixture. The reactor pressure was found to have the strongest influence on nucleation of nanocrystalline diamond films. The range of Ar concentration in the CH4/H2/Ar mixture that permits the deposition of nanocrystalline diamond (NCD) Film at 40 torr is 90%, while the Ar concentration needed for the transition into nanocrystalline diamond phase is 50% at 5 torr. Such pressure dependence of the nanocrystalline diamond Film growth is suggested to result from two competing effects of pressure on the concentration of reactive species near the Film growth surface, and the C2 density at lower pressure (5 torr) is higher than that at high pressure (40 torr) at the same Ar concentration.
Keywords :
chemical vapour deposition; diamond; high-pressure effects; nanostructured materials; nucleation; C; film growth surface; gas mixture; hot filament CVD technique; hot filament chemical vapor deposition; nanocrystalline diamond films deposition; nucleation; pressure 40 torr; pressure 5 torr; reactor pressure; Nanoelectronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1572-4
Electronic_ISBN :
978-1-4244-1573-1
Type :
conf
DOI :
10.1109/INEC.2008.4585636
Filename :
4585636
Link To Document :
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