DocumentCode :
2369368
Title :
A 3×3, 5µm pitch, 3-transistor single photon avalanche diode array with integrated 11V bias generation in 90nm CMOS technology
Author :
Henderson, Robert K. ; Webster, Eric A G ; Walker, Richard ; Richardson, Justin A. ; Grant, Lindsay A.
Author_Institution :
Sch. of Eng., Univ. of Edinburgh, Edinburgh, UK
fYear :
2010
fDate :
6-8 Dec. 2010
Abstract :
A 3×3 prototype image sensor array consisting of 2μm diameter CMOS avalanche photodiodes with 3-transistor NMOS pixel circuitry is integrated in a 90nm CMOS image sensor technology. The 5μm pixel pitch is the smallest achieved to date and is obtained with <;1% crosstalk, 250Hz mean dark count rate (DCR) at 20C, 36% photon detection efficiency at 410nm (PDE) and 107ps FWHM jitter. The small pixel pitch makes it possible to recover the 12.5% fill factor by standard wafer-level microlenses. A 5-stage capacitive charge pump generates the 11V breakdown voltage from a standard 2.5V supply obviating external high voltage generation.
Keywords :
CMOS image sensors; avalanche photodiodes; charge pump circuits; crosstalk; 3-transistor NMOS pixel circuitry; 3-transistor single photon avalanche diode array; CMOS avalanche photodiode; CMOS image sensor technology; FWHM jitter; capacitive charge pump; crosstalk; dark count rate; frequency 250 Hz; image sensor array; integrated bias generation; photon detection efficiency; size 2 mum; size 5 mum; size 90 nm; voltage 11 V; voltage 2.5 V; wafer-level microlenses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0163-1918
Print_ISBN :
978-1-4424-7418-5
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2010.5703359
Filename :
5703359
Link To Document :
بازگشت