Title :
A miniature actively recharged single-photon detector free of afterpulsing effects with 6ns dead time in a 0.18µm CMOS technology
Author :
Niclass, Cristiano ; Soga, Mineki
Author_Institution :
Toyota Central R&D Labs., Inc., Nagakute, Japan
Abstract :
A CMOS single-photon detector, including a highly miniaturized active recharge circuit, achieving the highest counting rate yet reported for an afterpulsing-free Geiger-mode photodiode is introduced. Thanks to its low-noise and 6-ns dead time figure, a dynamic-range of 116dB for steady-state photon counting in a single acquisition time of 20ms was achieved.
Keywords :
CMOS integrated circuits; Geiger counters; avalanche diodes; photodetectors; photodiodes; photon counting; CMOS technology; Geiger mode photodiode; low noise; miniaturized active recharge circuit; single photon detector; size 0.18 mum; steady-state photon counting; time 20 ms; time 6 ns;
Conference_Titel :
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4424-7418-5
Electronic_ISBN :
0163-1918
DOI :
10.1109/IEDM.2010.5703360
