DocumentCode :
236958
Title :
PCB via to trace return loss optimization for >25Gbps serial links
Author :
Ji Zhang ; Lim, Jungyoul ; Wei Yao ; Qiu, K. ; Brooks, Richard
Author_Institution :
Cisco Syst., Inc., San Jose, CA, USA
fYear :
2014
fDate :
4-8 Aug. 2014
Firstpage :
619
Lastpage :
624
Abstract :
High speed serial links usually have extremely tight requirement on the quality of the signal channels, in terms of insertion loss and return loss. Along with an end-to-end channel design, the transition from plated-through-hole (PTH) via to fan-out traces on printed circuit board (PCB) creates unavoidable impedance discontinuity, which greatly impacts the channel return loss performance. It is important to understand and model this discontinuity for optimization purpose. This paper discusses several approaches of improving the channel´s properties, by optimizing the via-to-trace transition. Considering the impedance continuity at via to trace fan-out region, usually bigger anti-pad size (to reduce capacitive discontinuity) and larger return-path area (to reduce inductive discontinuity) are employed. In this paper, we inserted a short segment of fan-out-traces, named as “transition traces”, with slightly lower impedance than the system impedance; it significantly helps on improving the overall return loss performance, while being able to take care of the above-mentioned capacitive and inductive discontinuities very well. Besides, the impact of various parameters, including transition trace impedance, anti-pad sizes on different layers, is analyzed; and the optimum combination of these design parameters is suggested. Lastly, the manufactured test board is measured to verify the optimization method.
Keywords :
optimisation; printed circuits; radio links; vias; PCB; PTH via; anti-pad size; capacitive discontinuity; channel return loss performance; end-to-end channel design; fan-out traces; fan-out-traces; high speed serial links; impedance discontinuity; inductive discontinuity; insertion loss; plated-through-hole via; printed circuit board; return-path area; signal channels; transition trace impedance; transition traces; via-to-trace transition; Capacitance; Impedance; Inductance; Optimization; Probes; Resonant frequency; Routing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-5544-2
Type :
conf
DOI :
10.1109/ISEMC.2014.6899045
Filename :
6899045
Link To Document :
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