DocumentCode :
2369580
Title :
Theory of workfunction control of silicides by doping for future Si-nano-devices based on fundamental physics of why silicides exist in nature
Author :
Nakayama, T. ; Kakushima, K. ; Nakatsuka, O. ; Machida, Y. ; Sotome, S. ; Matsuki, T. ; Ohmori, K. ; Iwai, H. ; Zaima, S. ; Chikyow, T. ; Shiraishi, K. ; Yamada, K.
Author_Institution :
Dept. of Phys., Chiba Univ., Chiba, Japan
fYear :
2010
fDate :
6-8 Dec. 2010
Abstract :
We have revealed by the first-principles calculations that the workfunction of silicide is controlled by the high-density dopant existing in the silicide itself, and the selective doping into Si or Ni site is essential to realize such control. In addition, we showed that these doping properties are closely related to fundamental physics of silicides; why NixSiy exists and why AuxSiy not exists in nature. These findings might give a new guideline to design silicide-electrode contacts for future 10nm nano-devices.
Keywords :
ab initio calculations; electrodes; nickel compounds; semiconductor doping; work function; Ni site; NixSiy; Si nanodevices; Si site; doping; first principles calculations; high-density dopant; silicide-electrode contacts; silicides; size 10 nm; work function control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0163-1918
Print_ISBN :
978-1-4424-7418-5
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2010.5703369
Filename :
5703369
Link To Document :
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