Title :
Reduced-dimension multiuser detection
Author :
Xie, Yao ; Eldar, Yonina C. ; Goldsmith, Andrea J.
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
Abstract :
We explore several reduced-dimension multiuser detection (RD-MUD) structures that significantly decrease the number of required correlation branches at the receiver front-end, while still achieving performance similar to that of the conventional matched-filter (MF) bank. RD-MUD exploits the fact that the number of active users is typically small relative to the total number of users in the system and relies on ideas of analog compressed sensing to reduce the number of correlators. We first develop a general framework for both linear and nonlinear RD-MUD structures. We then present theoretical performance analysis for two specific detectors: the linear reduced-dimension decorrelating (RDD) detector, which combines subspace projection and thresholding to determine active users and sign detection for data recovery, and the nonlinear reduced-dimension decision-feedback (RDDF) detector, which combines decision-feedback orthogonal matching pursuit for active user detection and sign detection for data recovery. The theoretical performance results for both detectors are validated via numerical simulations.
Keywords :
channel bank filters; compressed sensing; correlation methods; iterative methods; matched filters; multiuser detection; time-frequency analysis; MF bank; RDD detector; RDDF detector; active user detection; analog compressed sensing; data recovery; decision-feedback orthogonal matching pursuit; linear RD-MUD structures; linear reduced-dimension decorrelating detector; matched-filter bank; nonlinear RD-MUD structures; nonlinear reduced-dimension decision-feedback detector; numerical simulations; receiver front-end; reduced-dimension multiuser detection; sign detection; subspace projection; Complexity theory; Correlators; Decorrelation; Detectors; Multiuser detection; Noise; Vectors;
Conference_Titel :
Communications (ICC), 2012 IEEE International Conference on
Conference_Location :
Ottawa, ON
Print_ISBN :
978-1-4577-2052-9
Electronic_ISBN :
1550-3607
DOI :
10.1109/ICC.2012.6364003