DocumentCode :
2369751
Title :
A two-phase clustering approach for peak alignment in mining mass spectrometry data
Author :
Chen, Lien-Chin ; Liu, Yu-Cheng ; Liu, Chi-Wei ; Tseng, Vincent S.
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
fYear :
2009
fDate :
1-4 Nov. 2009
Firstpage :
226
Lastpage :
230
Abstract :
In recent years, the mass spectrometry technologies emerge as useful tools for biomarker discovery through studying protein profiles in various biological specimens. In mining mass spectrometry datasets, peak alignment is a critical issue among the preprocessing steps that affect the quality of analysis results. In this paper, we proposed a novel algorithm named Two-Phases Clustering for peak Alignment (TPC-Align) to align mass spectrometry peaks across samples in the pre-processing phase. The TPC-Align algorithm sequentially considers the distribution of intensity values and the locations of mass-to-charge ratio values of peaks between samples. Moreover, TPC-Align algorithm can also report a list of significantly differential peaks between samples, which serve as the candidate biomarkers for further biological study. The proposed peak alignment method was compared to the current peak alignment approach based on one-dimension hierarchical clustering through experimental evaluations, and the results show that TPC-Align outperforms the traditional method on the real dataset.
Keywords :
bioinformatics; data mining; mass spectroscopy; pattern clustering; proteins; biomarker discovery; mass spectrometry data mining; mass spectrometry technologies; one-dimension hierarchical clustering; peak alignment method; protein profiles; two-phase clustering; Biomarkers; Cancer; Clustering algorithms; Computer science; Data mining; Filters; Ionization; Mass spectroscopy; Proteomics; Smoothing methods; Biomarker discovery; Clustering; Mass spectrometry analysis; Peak alignment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bioinformatics and Biomedicine Workshop, 2009. BIBMW 2009. IEEE International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-5121-0
Type :
conf
DOI :
10.1109/BIBMW.2009.5332099
Filename :
5332099
Link To Document :
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