Title :
Impact on signal integrity of interconnect variabilities
Author :
Manfredi, Paolo ; Vande Ginste, Dries ; De Zutter, Daniel ; Canavero, Flavio G.
Author_Institution :
Dept. of Electron. & Telecommun., Politec. di Torino, Turin, Italy
Abstract :
In this paper, literature results on the statistical simulation of lossy and dispersive interconnect networks with uncertain physical properties are extended to general nonlinear circuits. The approach is based on the expansion of circuit voltages and currents into polynomial chaos approximations. The derivation of deterministic circuit equivalents for nonlinear components allows to retrieve the unknown expansion coefficients with a single circuit simulation, that can be carried out via standard SPICE-type solvers. These coefficients provide direct statistical information. The methodology allows the inclusion of arbitrary nonlinear elements and is validated via transmission-line networks terminated by diodes and driven by inverters.
Keywords :
SPICE; chaos; circuit simulation; integrated circuit interconnections; polynomial approximation; statistical analysis; arbitrary nonlinear elements; deterministic circuit equivalents; dispersive interconnect networks; expansion coefficients; general nonlinear circuits; interconnect variabilities; lossy interconnect networks; nonlinear components; polynomial chaos approximations; signal integrity; Integrated circuit interconnections; Integrated circuit modeling; Mathematical model; Monte Carlo methods; Polynomials; Standards; Circuit simulation; SPICE; nonlinear; polynomial chaos; signal integrity; statistical Analysis; transmission lines;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-5544-2
DOI :
10.1109/ISEMC.2014.6899054