DocumentCode
236976
Title
Impact on signal integrity of interconnect variabilities
Author
Manfredi, Paolo ; Vande Ginste, Dries ; De Zutter, Daniel ; Canavero, Flavio G.
Author_Institution
Dept. of Electron. & Telecommun., Politec. di Torino, Turin, Italy
fYear
2014
fDate
4-8 Aug. 2014
Firstpage
673
Lastpage
678
Abstract
In this paper, literature results on the statistical simulation of lossy and dispersive interconnect networks with uncertain physical properties are extended to general nonlinear circuits. The approach is based on the expansion of circuit voltages and currents into polynomial chaos approximations. The derivation of deterministic circuit equivalents for nonlinear components allows to retrieve the unknown expansion coefficients with a single circuit simulation, that can be carried out via standard SPICE-type solvers. These coefficients provide direct statistical information. The methodology allows the inclusion of arbitrary nonlinear elements and is validated via transmission-line networks terminated by diodes and driven by inverters.
Keywords
SPICE; chaos; circuit simulation; integrated circuit interconnections; polynomial approximation; statistical analysis; arbitrary nonlinear elements; deterministic circuit equivalents; dispersive interconnect networks; expansion coefficients; general nonlinear circuits; interconnect variabilities; lossy interconnect networks; nonlinear components; polynomial chaos approximations; signal integrity; Integrated circuit interconnections; Integrated circuit modeling; Mathematical model; Monte Carlo methods; Polynomials; Standards; Circuit simulation; SPICE; nonlinear; polynomial chaos; signal integrity; statistical Analysis; transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location
Raleigh, NC
Print_ISBN
978-1-4799-5544-2
Type
conf
DOI
10.1109/ISEMC.2014.6899054
Filename
6899054
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