DocumentCode
2369764
Title
Characterization of the maximum test level in a reverberation chamber
Author
Lehman, T.H. ; Freyer, G.J.
Author_Institution
Sci. & Eng. Associates Inc., Albuquerque, NM, USA
fYear
1997
fDate
18-22 Aug 1997
Firstpage
44
Lastpage
47
Abstract
Among the significant characteristics of the electromagnetic environment in a reverberation chamber are isotropy, random polarization and uniformity. These characteristics permit robust immunity testing without moving the equipment under test or the field generating antenna. These characteristics have been repeatedly demonstrated for frequencies where the chamber is highly overmoded. In this case, the statistical electromagnetic test environment can be described in terms of a chi-square distribution. However, the maximum value of the test environment, which is generally the parameter of most interest for immunity testing, is a random variable. Thus there is a potential for an under or over test of the equipment under test. This paper discusses the distribution function for the maximum to mean ratio for an overmoded reverberation chamber. The paper addresses the expected value of the maximum to mean ratio and the uncertainty in the ratio for a given level of confidence. The paper also compares the theoretical predictions to experimental data
Keywords
electromagnetic compatibility; probability; reverberation chambers; statistical analysis; testing; EMC test facilities; chi-square distribution; distribution function; electromagnetic environment; equipment under test; field generating antenna; isotropy; maximum test level characterisation; overmoded reverberation chamber; random polarization; robust immunity testing; statistical electromagnetic test environment; Character generation; Distribution functions; Electromagnetic wave polarization; Immunity testing; Probability density function; Random variables; Reverberation chamber; Robustness; Statistical distributions; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1997. IEEE 1997 International Symposium on
Conference_Location
Austin, TX
Print_ISBN
0-7803-4140-6
Type
conf
DOI
10.1109/ISEMC.1997.667538
Filename
667538
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