Title :
Voltage fluctuation and flicker suppression by controllable reactor with robbustness control strategy
Author :
Xu, Gang ; Tian, Shiyang
Author_Institution :
Sch. of Electr. & Electron. Eng., North China Electr. Power Univ., Beijing, China
Abstract :
High power and nonlinear loads are the main equipment which have caused the voltage fluctuation, flicker and harmonic distortions. Power quality deteriorates and net loss increases resulted from voltage fluctuation, flicker and harmonic distortions with numerous high power and nonlinear loads accessed in power grid, which has affected the safety and stable operation of the power grid. Therefore, suppression of the harmonic distortion, voltage fluctuation and flicker is crucial. This paper take voltage grading and district dividing as background, an improved static var compensator (SVC) based controllable reactor with robustness control strategy is proposed in this paper. The improved SVC is available for higher voltage level in grid voltage grading and district dividing. The saturation degree of the controllable reactor is adjusted according to the fluctuation value of the reactive power, which can change the reactive power supplied by the reactor, thus the voltage fluctuation, flicker and harmonic distortion can be effectively suppressed.
Keywords :
harmonic distortion; harmonics suppression; power grids; power supply quality; reactive power; reactors (electric); robust control; safety; static VAr compensators; SVC; controllable reactor; district dividing; flicker suppression; grid voltage grading; harmonic distortions; net loss; nonlinear loads; power grid safety; power quality; reactive power; robbustness control strategy; saturation degree; static Var compensator; voltage fluctuation; Fluctuations; Inductors; Magnetic cores; Reactive power; Voltage control; Voltage fluctuations; Welding; SVC; controllable reactor; robustness control strategy; voltage fluctuation; voltage grading and district dividing;
Conference_Titel :
Environment and Electrical Engineering (EEEIC), 2012 11th International Conference on
Conference_Location :
Venice
Print_ISBN :
978-1-4577-1830-4
DOI :
10.1109/EEEIC.2012.6221590