Statistical methodologies for integrated circuits design

Author

Padovani, Andrea ; Chimenton, Andrea ; Olivo, Piero ; Fantini, Paolo ; Vendrame, Loris ; Mennillo, Serena

Author_Institution

Univ. di Ferrara, Ferrara

fYear

2007

fDate

2-5 July 2007

Firstpage

277

Lastpage

280

Abstract

The continuous scaling of physical dimensions has strongly increased circuit performance variability and the traditional corner-case methodology is becoming unreliable. As a consequence, there is an urgent need for new and more accurate statistical models. In this scenario, the purpose of this paper is twofold: 1) to give the reader the basic concepts of statistical modeling, and 2) to discuss a viable statistical approach that could be adopted into a traditional IC design flow for the next technology generations.

Keywords

design of experiments; integrated circuit design; integrated circuit manufacture; integrated circuit modelling; IC design flow; circuit performance; continuous physical dimensions scaling; integrated circuits design; statistical methodologies; statistical modeling; Circuit optimization; Circuit simulation; Circuit testing; Integrated circuit modeling; Integrated circuit noise; Integrated circuit synthesis; Manufacturing processes; Robustness; Statistical analysis; Uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Research in Microelectronics and Electronics Conference, 2007. PRIME 2007. Ph.D.

Conference_Location

Bordeaux

Print_ISBN

978-1-4244-1000-2

Electronic_ISBN

978-1-4244-1001-9

Type

conf

DOI

10.1109/RME.2007.4401866

Filename

4401866