DocumentCode :
2370371
Title :
An offset cancellation bit-line sensing scheme for low-voltage DRAM applications
Author :
Sang Hoon Hong ; Si Hong Kim ; Se Jun Kim ; Jae-Kyung Wee ; Jin Yong Chung
Author_Institution :
Hynix Semiconductor Inc.
Volume :
2
fYear :
2002
fDate :
7-7 Feb. 2002
Firstpage :
116
Lastpage :
427
Keywords :
Breakdown voltage; CMOS technology; Circuit testing; Low voltage; Low-noise amplifiers; Noise cancellation; Noise reduction; Operational amplifiers; Random access memory; Semiconductor device noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
Type :
conf
DOI :
10.1109/ISSCC.2002.992170
Filename :
992170
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2370371
بازگشت