• DocumentCode
    2370371
  • Title

    An offset cancellation bit-line sensing scheme for low-voltage DRAM applications

  • Author

    Sang Hoon Hong ; Si Hong Kim ; Se Jun Kim ; Jae-Kyung Wee ; Jin Yong Chung

  • Author_Institution
    Hynix Semiconductor Inc.
  • Volume
    2
  • fYear
    2002
  • fDate
    7-7 Feb. 2002
  • Firstpage
    116
  • Lastpage
    427
  • Keywords
    Breakdown voltage; CMOS technology; Circuit testing; Low voltage; Low-noise amplifiers; Noise cancellation; Noise reduction; Operational amplifiers; Random access memory; Semiconductor device noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-7335-9
  • Type

    conf

  • DOI
    10.1109/ISSCC.2002.992170
  • Filename
    992170
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2370371