Title :
An improved algorithm to evaluate the reliability of a circular consecutive 2-out-of-r-from-n:F system
Author :
Higashiyama, Yoichi ; Kraetzl, Miro ; Caccetta, Lou
Author_Institution :
Ehime University
Keywords :
Detectors; Error correction; Inspection; Mathematics; Reliability engineering; Statistics; Tin;
Conference_Titel :
SICE '96. Proceedings of the 35th SICE Annual Conference. International Session Papers
Print_ISBN :
0-7803-3751-4
DOI :
10.1109/SICE.1996.865433
