Title :
Electro-mechanical structures for channel emulation
Author :
Shinde, Satyajeet ; Sen Yang ; Erickson, Nicholas ; Pommerenke, David ; Chong Ding ; White, Douglas ; Scearce, Stephen ; Yaochao Yang
Author_Institution :
Missouri S&T EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
Channel emulators are used to evaluate communication system performance either in absence of the real channel or to test the system´s response for varying channel characteristics. For high speed differential digital channels bandwidths in excess of 20 GHz are common making it difficult to recreate the channel performance by electronic means such as FIR filters. An alternative solution is using a low loss short transmission line and having its properties modified by mechanical means. Passive structures are robust, have a frequency range only limited by the low loss trace, do not add noise, cannot be damaged by ESD and are very economical. This paper describes two electro-mechanical structures for introducing loss and nulling into the frequency response of a channel. The first part describes the design of a mechanically tuned quarter-wavelength stub filter that can be used to emulate the resonances of a channel. In the second part, an electromechanical structure, consisting of Bragg grating and lossy materials, is constructed to emulate the loss behaviour and the resonances of a channel.
Keywords :
FIR filters; digital communication; electrostatic discharge; telecommunication channels; transmission lines; Bragg grating; ESD; FIR filters; channel emulation; communication system performance evaluation; electro-mechanical structures; high speed differential digital channel bandwidths; loss behaviour emulation; lossy materials; low loss short transmission line; low loss trace; mechanically tuned quarter-wavelength stub filter; passive structures; Electron tubes; Finite impulse response filters; Impedance; Materials; Metals; Microstrip; Resonant frequency;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-5544-2
DOI :
10.1109/ISEMC.2014.6899103