DocumentCode
2370763
Title
A new probabilistic Iris Quality Measure for comprehensive noise detection
Author
Krichen, Emine ; Garcia-Salicetti, Sonia ; Dorizzi, Bernadette
Author_Institution
Inst. Nat. des Telecommun, Evry
fYear
2007
fDate
27-29 Sept. 2007
Firstpage
1
Lastpage
6
Abstract
In this article, we present a novel probabilistic iris quality measure based on a Gaussian mixture model (GMM). We compare its behavior to that of other standard iris quality metrics on two different types of noise which can corrupt the iris texture: occlusions and blurring. In the case of occlusions, we compare our GMM-based quality measure to an active contour method for eyelids and eyelashes detection. Finally, in the case of iris blurring, we compare our quality measure to a standard method based on Fourier transform and wavelets. For the latter, we have developed a new method to detect blur suitable for iris images. In our tests, we have used the ICE 2005 database and OSIRIS, an iris reference system based on the classical approach proposed by Daugman and developed in the framework of BioSecure European Network of Excellence for comparative evaluation purposes. Experiments show a significant improvement of performance when our GMM- based quality measure is used instead of the classical methods above mentioned. In particular, results show that this probabilistic quality measure based on a GMM trained on good quality images is independent from the kind of noise involved.
Keywords
Fourier transforms; Gaussian processes; edge detection; image texture; wavelet transforms; Fourier transform; GMM; Gaussian mixture model; active contour method; comprehensive noise detection; iris blurring; iris images; iris occlusions; iris reference system; iris texture; probabilistic iris quality measure; wavelets transform; Active contours; Eyelashes; Eyelids; Fourier transforms; Ice; Image databases; Iris; Measurement standards; Noise measurement; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Biometrics: Theory, Applications, and Systems, 2007. BTAS 2007. First IEEE International Conference on
Conference_Location
Crystal City, VA
Print_ISBN
978-1-4244-1596-0
Electronic_ISBN
978-1-4244-1597-7
Type
conf
DOI
10.1109/BTAS.2007.4401906
Filename
4401906
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