Title :
Ovonic unified memory - a high-performance nonvolatile memory technology for stand-alone memory and embedded applications
Author :
Gill, M. ; Lowrey, T. ; Park, J.
Author_Institution :
Intel Corporation
Keywords :
CMOS process; CMOS technology; Conducting materials; Crystalline materials; Diodes; Logic arrays; Materials testing; Nonvolatile memory; Phase change materials; Vehicles;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.992192
