Title :
Reducing leakage with mixed-Vth (MVT)
Author :
Sill, Frank ; Grassert, Frank ; Timmermann, Dirk
Author_Institution :
Rostock Univ., Germany
Abstract :
We present a new method for assignment of devices with different Vth in a double-Vth-process, whereas leakage is reduced and performance increases or is constant. A mixed-Vth gate type is developed, which renders new masks unnecessary. As compared with known methods, our approach achieves an additional leakage reduction of 25% while leakage reduction in raw designs is average 65%.
Keywords :
CMOS integrated circuits; integrated circuit design; leakage currents; low-power electronics; double-Vth-process; leakage reduction; mixed-Vth gate type; Delay effects; Design optimization; Doping; Dynamic voltage scaling; Leakage current; Power dissipation; Semiconductor device modeling; Subthreshold current; Threshold voltage; Timing;
Conference_Titel :
VLSI Design, 2005. 18th International Conference on
Print_ISBN :
0-7695-2264-5
DOI :
10.1109/ICVD.2005.147
