DocumentCode :
2370967
Title :
Multiscale analysis to facilitate joint chaos and fractal analysis of biosignals
Author :
Jianbo Gao ; Lasch, E.B. ; Qian Chen
Author_Institution :
MME, Wright State Univ., Dayton, OH, USA
fYear :
2012
fDate :
25-27 July 2012
Firstpage :
96
Lastpage :
102
Abstract :
Biological systems provide definite examples of multiscale systems, which generate nonlinear, non-stationary, and highly complex signals. Developing effective methods for biosignal analysis has become increasingly important, owing to rapid progress in biosensing and astronomical accumulation of biological data. Albeit chaos and random fractal theories are among the most popular and most promising methods for biosignal analysis, they often may not be directly applicable, since chaos analysis requires that signals be relatively noise-free and stationary, and fractal analysis demands signals to be non-rhythmic and scale-free, which are rarely true in biology. We propose two multiscale approaches for biosignal analysis, adaptive fractal analysis and scale-dependent Lyapunov exponent (SDLE) analysis, and show that together they can tremendously facilitate joint chaos and multiscale analysis of biosignals.
Keywords :
Lyapunov methods; adaptive signal processing; chaos; electroencephalography; fractals; medical disorders; medical signal processing; signal denoising; Albeit chaos; EEG epileptic seizure detection; adaptive fractal analysis; astronomical accumulation; biological data; biological systems; biosensing; biosignal analysis; electroencephalography; highly complex signals; joint chaos; multiscale analysis; multiscale systems; noise-free signal; nonlinear complex signals; nonrhythmic signal; nonstationary complex signals; random fractal theories; scale-dependent Lyapunov exponent analysis; scale-free signal; stationary signal; EEG epileptic seizure detection; adaptive filtering; biosignal; chaos; fractal; multiscale analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference (NAECON), 2012 IEEE National
Conference_Location :
Dayton, OH
ISSN :
0547-3578
Print_ISBN :
978-1-4673-2791-6
Type :
conf
DOI :
10.1109/NAECON.2012.6531036
Filename :
6531036
Link To Document :
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