Title :
A built-in self-test approach for medium to high-resolution digital-to-analog converters
Author :
Arabi, Karim ; Kaminska, Bozena ; Rzeszut, Janusz
Author_Institution :
Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
Abstract :
A test approach and circuitry suitable for built-in self-test (BIST) of medium to high-resolution digital-to-analog (D/A) converter are described. Offset, gain, linearity and differential linearity errors are tested without using mixed-mode or logic test equipment. The proposed BIST structure presents a compromise between test cost, area overhead and test time. The BIST circuitry has been designed using CMOS 1.2 μm technology. The simulations performed show that the BIST is applicable for testing D/A converters up to 16-bits resolution. By a minor modification the test structure would be able to localize the fail situation and to test all D/A converters on the chip
Keywords :
CMOS integrated circuits; automatic testing; built-in self test; design for testability; digital-analogue conversion; integrated circuit testing; logic testing; BIST; BIST circuitry; BIST structure; CMOS; D/A converters; area overhead; autozeroing; built-in self-test; differential linearity errors; digital-to-analog converters; gain; high-resolution digital-to-analog converter; linearity; logic test equipment; minor modification; mixed-mode; simulations; test cost; test structure; test time; Analog circuits; Analog-digital conversion; Built-in self-test; CMOS technology; Circuit testing; Digital-analog conversion; Integrated circuit testing; Linearity; Logic testing; Voltage;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367203
