DocumentCode :
2371091
Title :
Phase Conjugate Interferometry For Thin Film Analysis
Author :
Parshall, E.R. ; Cronin-Colomb, M.
Author_Institution :
Tufts University
fYear :
1990
fDate :
16-20 July 1990
Firstpage :
281
Lastpage :
282
Keywords :
Detectors; Ellipsometry; Mirrors; Optical interferometry; Optimized production technology; Phase detection; Phase measurement; Reflectivity; Thin film devices; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nonlinear Optics: Materials, Phenomena and Devices, 1990. Digest. NLO '90.
Conference_Location :
Kauai, HI, USA
Type :
conf
DOI :
10.1109/NLO.1990.695955
Filename :
695955
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2371091
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