Title :
A diagnostic network for massively parallel processing systems
Author :
Choi, Yoon-Hwa ; Kim, Yu-Seok
Author_Institution :
Dept. of Comput. Eng., Hong Ik Univ., Seoul, South Korea
Abstract :
Massively parallel processing systems consist of a large number of processing nodes to provide high performance primarily for data-intensive applications. In a system of such dimensions high availability cannot be achieved without relying on redundancy and reconfiguration. An important aspect of highly available design is rapid diagnosis and graceful degradation in the event of a failure. This paper presents a diagnostic network for locating faults in massively parallel processing systems comprised of identical processing nodes
Keywords :
computer testing; parallel architectures; redundancy; data-intensive applications; diagnostic network; dual tree diagnostic network; failure; fault diagnosis; graceful degradation; high availability; identical processing nodes; massively parallel processing systems; reconfiguration; redundancy; Application software; Availability; Binary trees; Circuit faults; Circuit testing; Concurrent computing; Data engineering; Parallel processing; Switches; System testing;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367207
