DocumentCode
2371210
Title
A determination of the SI value of QHR by the cross-capacitor in NIM
Author
Zhang Zhonghua ; Wang Xiaochao ; Wang Dengan ; Li Xianjie ; He Qing ; Ruan Yongshun
Author_Institution
Nat. Inst. of Metrol., Beijing, China
fYear
1996
fDate
17-21 June 1996
Firstpage
12
Lastpage
13
Abstract
The determination of the SI value of quantized Hall resistance (QHR) by a cross-capacitor in NIM was completed in the spring of 1994. The SI value of QHR (i=1) was found to be R/sub H/=25812.8084(34) /spl Omega/ with an uncertainty of 0.132 ppm (1/spl sigma/). A CCC system is also being developed in NIM.
Keywords
capacitors; electric resistance measurement; error analysis; measurement errors; quantum Hall effect; units (measurement); NIM; QHR; SI value; cross-capacitor; measurement units; Bridge circuits; Capacitance; Collision mitigation; Cryogenics; Electrical resistance measurement; Measurement standards; Resistors; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location
Braunschweig, Germany
Print_ISBN
0-7803-3376-4
Type
conf
DOI
10.1109/CPEM.1996.546532
Filename
546532
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