Title :
A determination of the SI value of QHR by the cross-capacitor in NIM
Author :
Zhang Zhonghua ; Wang Xiaochao ; Wang Dengan ; Li Xianjie ; He Qing ; Ruan Yongshun
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
Abstract :
The determination of the SI value of quantized Hall resistance (QHR) by a cross-capacitor in NIM was completed in the spring of 1994. The SI value of QHR (i=1) was found to be R/sub H/=25812.8084(34) /spl Omega/ with an uncertainty of 0.132 ppm (1/spl sigma/). A CCC system is also being developed in NIM.
Keywords :
capacitors; electric resistance measurement; error analysis; measurement errors; quantum Hall effect; units (measurement); NIM; QHR; SI value; cross-capacitor; measurement units; Bridge circuits; Capacitance; Collision mitigation; Cryogenics; Electrical resistance measurement; Measurement standards; Resistors; Uncertainty;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.546532
