DocumentCode :
2371267
Title :
Data path synthesis for easy testability
Author :
Dhodhi, Muhanunad K. ; Ahmad, Imtiaz ; Ismaeel, Asad A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Kuwait Univ., Safat, Kuwait
fYear :
1994
fDate :
15-17 Nov 1994
Firstpage :
317
Lastpage :
322
Abstract :
Synthesizing digital circuits which can be easily tested is an important and necessary aspect of a useful behavioral synthesis system. Testability at behavioral level can be enhanced by minimizing the number of self-adjacent registers (self-loops). This paper describes a technique for synthesizing an easy testable (loop-free) data path structure from a behavioral description of a design. The synthesis process uses an approach based on a problem-space genetic algorithm (PSGA) to perform concurrent scheduling and allocation of testable functional units to eliminate the self-loops. Experiments on benchmarks show that the self-loops can be eliminated with a minimum additional hardware resources to result in a testable data path
Keywords :
concurrent engineering; design for testability; genetic algorithms; logic design; logic testing; resource allocation; scheduling; shift registers; benchmarks; data path structure; data path synthesis; problem-space genetic algorithm; scheduling; self-adjacent registers; self-loops; synthesis process; testability; testable data path; testable functional units; Automatic testing; Benchmark testing; Circuit synthesis; Circuit testing; Digital circuits; Genetic algorithms; Hardware; Performance evaluation; Registers; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
Type :
conf
DOI :
10.1109/ATS.1994.367212
Filename :
367212
Link To Document :
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