Title :
Design of pseudo-random patterns with low linear dependence and equi-distribution
Author :
Matsufuji, Shinya ; Tadaki, Shin-ichi ; Yamanaka, Teruki
Author_Institution :
Dept. of Inf. Sci., Saga Univ., Japan
Abstract :
Pseudo-random patterns with equi-distribution given by some phase-shifted M-sequences are often used to produce random numbers used in simulations and test patterns in VLSI tests. Low linear dependency is one of the desirable and important properties of random patterns as well as equi-distribution. This paper discusses pseudo-random patterns with equi-distribution and low linear dependence
Keywords :
VLSI; correlation methods; integrated logic circuits; logic design; logic testing; random processes; VLSI tests; bit pattern correlation; equi-distribution; linear dependence; low linear dependency; phase-shifted M-sequences; pseudo-random patterns; Automata; Ear; Hybrid power systems; Information science; Physics; Polynomials; Shift registers; Testing; Transportation; Very large scale integration;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367219
