Title :
Detectability of spurious signals with limited propagation in combinational circuits
Author :
Moll, Francesc ; Roca, Miquel ; Marche, David ; Rubio, Antonio
Author_Institution :
Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain
Abstract :
The continuous reduction in scale achieved in microelectronic technology and the increasing switching speed may cause parasitic or spurious signals to appear, due to crosstalk. In this work, scale reduction of interconnections is analyzed, showing the increasing mutual capacitance and a model of crosstalk considering parasitic capacitive coupling is shown. A method for studying the propagation limits of crosstalk signals has been developed for combinational circuits. An algorithm for crosstalk faults test pattern generation is proposed taking into account the propagation limitation of the signals. Results of the implementation of the algorithm are shown, putting into evidence the dependency of the detectability of spurious signals on their propagation limits
Keywords :
VLSI; combinational circuits; crosstalk; digital simulation; fault diagnosis; fault location; integrated circuit noise; logic testing; RAPHAEL; combinational circuits; crosstalk; detectability; interconnections; limited propagation; microelectronic technology; mutual capacitance; parasitic capacitive coupling; propagation limits; reduction in scale; scale reduction; spurious signals; switching speed; test pattern generation; Circuit faults; Combinational circuits; Coupling circuits; Crosstalk; Integrated circuit interconnections; Microelectronics; Mutual coupling; Parasitic capacitance; Signal detection; Test pattern generators;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367232