Title :
Sequential test generation in massive observability environments
Author_Institution :
CrossCheck Technol. Inc., San Jose, CA, USA
Abstract :
This paper describes a sequential test generation method for circuits in massive observability environments such as those offered by quiescent current monitoring and gate arrays with embedded test points. Techniques to enhance the controllability of the circuit are also discussed and an algorithm for selecting storage elements to make accessible during the test mode is proposed
Keywords :
automatic programming; automatic testing; controllability; fault diagnosis; logic testing; observability; sequential circuits; ATPG; CrossCheck; IDDQ testing; controllability; embedded test points; gate arrays; massive observability environments; quiescent current monitoring; sequential test generation; storage elements; Automatic test pattern generation; Circuit faults; Circuit testing; Mesh generation; Monitoring; Observability; Sequential analysis; Sequential circuits; Switches; Switching circuits;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367243
