DocumentCode
2371836
Title
Efficient fault ordering for automatic test pattern generation for sequential circuits
Author
Krauss, Peter A. ; Henftling, Manfred
Author_Institution
Dept. of Electr. Eng., Tech. Univ. Munchen, Germany
fYear
1994
fDate
15-17 Nov 1994
Firstpage
113
Lastpage
118
Abstract
This paper analyzes fault dependency in sequential circuits to accelerate parallel automatic test pattern generation (ATPG). We present the new algorithms improved fault collapsing and fault arranging for an efficient fault ordering to speedup ATPG. Experimental results obtained for sequential and fault parallel ATPG show the efficiency of the proposed methods
Keywords
automatic programming; automatic testing; fault diagnosis; fault location; logic testing; probability; sequential circuits; efficiency; efficient fault ordering; fault arranging; fault arranging heuristics; fault collapsing; fault parallel ATPG; parallel automatic test pattern generation; sequential ATPG; sequential circuits; test pattern generation; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Sequential analysis; Sequential circuits; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location
Nara
Print_ISBN
0-8186-6690-0
Type
conf
DOI
10.1109/ATS.1994.367244
Filename
367244
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