Title :
Efficient fault ordering for automatic test pattern generation for sequential circuits
Author :
Krauss, Peter A. ; Henftling, Manfred
Author_Institution :
Dept. of Electr. Eng., Tech. Univ. Munchen, Germany
Abstract :
This paper analyzes fault dependency in sequential circuits to accelerate parallel automatic test pattern generation (ATPG). We present the new algorithms improved fault collapsing and fault arranging for an efficient fault ordering to speedup ATPG. Experimental results obtained for sequential and fault parallel ATPG show the efficiency of the proposed methods
Keywords :
automatic programming; automatic testing; fault diagnosis; fault location; logic testing; probability; sequential circuits; efficiency; efficient fault ordering; fault arranging; fault arranging heuristics; fault collapsing; fault parallel ATPG; parallel automatic test pattern generation; sequential ATPG; sequential circuits; test pattern generation; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Sequential analysis; Sequential circuits; Test pattern generators;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367244
